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Terrestrial neutron-induced soft errors in advanced memory devices /   Publication: Hackensack, NJ : World Scientific, 2008 . xxii, 343 p. : 24 cm. Date:2008 Availability: Copies available: AUM Main Library (1),
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Nonvolatile memory technologies with emphasis on Flash : , a comprehensive guide to understanding and using NVM devices /   Publication: Hoboken, NJ : Wiley, 2008 . xxv, 759 p. : 26 cm. Date:2008 Availability: Copies available: AUM Main Library (1),
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